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Quantitative Dependability Modeling of Smart Grids with Consideration of Cyber-Physical Interdependencies
S. Sedigh Sarvestani (firstname.lastname@example.org), K. Marashi, and A. R. Hurson
Dept. of Education; Dept. of Transportation; Intelligent Systems Center (Missouri S&T); Center for Infrastructure Engineering Studies (Missouri S&T); IntelliSpeak, LLC
This research seeks to facilitate analysis of the reliability and survivability achieved by smart grids. To this end, we have proposed an analytical reliability model and a survivability analysis method that capture the effect of impairments originating from both physical and cyber components, as well as the effect of cyber-physical interdependencies among these components. We investigate the use of simulation-based fault injection to instantiate the model with failure data. We aim to categorize and quantify dependencies in the smart grid and analyze the impact on reliability of introducing additional interdependencies. A pending case study investigates the effect of physical and cyber improvements on overall reliability of the smart grid, and demonstrates that flawed cyber infrastructure can result in lower reliability than that of a conventional power grid with less advanced control. Additional detail on the project is available at web.mst.edu/~sendecomp
- “Quantitative reliability modeling of smart grids with consideration of cyber-physical interdependencies,” K. Marashi and S. Sedigh, IEEE Trans. Reliability, 2016, under review.
- “Survivability evaluation and importance analysis for complex networked systems,” M. Woodard, K. Marashi, and S. Sedigh, IEEE Trans. Network Science and Engineering, 2016, under review.
- “Quantification and analysis of interdependency in cyber-physical systems,” K. Marashi, S. Sedigh, and A. R. Hurson, in Proc. of the 3rd Int. Workshop on Reliability and Security Aspects for Critical Infrastructure Protection (ReSA4CI ’16), (Toulouse, France), pp. 149–154, June 2016.
- “Towards comprehensive modeling of reliability for smart grids: Requirements and challenges,”K. Marashi and S. Sedigh, in Proc. of the 15th IEEE Int. High Assurance Syst. Eng. Sym- posium (HASE ’14), (Miami, FL), pp. 105–112, January 2014.